Seeing at the Nanoscale V Conference

Seeing at the Nanoscale V Conference

June 24-27. 2007
University of California
Santa Barbara

Register now and join other users of scanning probe microscopy as they
meet and discuss their work informally with colleagues from all over the
world at the fifth annual Seeing at the Nanoscale Conference, University
of California, Santa Barbara. Sponsored by Veeco Instruments and the
California NanoSystems Institute (CNSI), the conference includes
two-and-one-half day technical presentations and a poster session on the
following topics:

* Extending the Limits of SPM: High Speed Scanning, Ultra High
Resolution Imaging, Multiple Probe SPM

* From Single Biomolecules To Cells: Using AFM and Combined
AFM-Optical Techniques to Probe Biological Structures and Forces

* Next Generation Materials and Polymer Systems

* Beyond Topography: Measurement of Physical Properties at the
Nanoscale - Nanomechanical, Electrical, Optical, Magnetic and Thermal

* Instruments and Probes - New Tools and Techniques for
Nanoscience

For more information and to register, please go to
www.veeco.com/Nanoconference
Received on Thu May 10 07:46:41 2007