Re: Problem NTFS [Vista]

Autor: DZB <dzikiborsuk_at_NOSPAM.gazeta.pl>
Data: Thu 02 Apr 2009 - 12:15:36 MET DST
Message-ID: <gr2388$d5a$1@inews.gazeta.pl>
Content-Type: text/plain; charset=ISO-8859-2

Nazgul <a_zbierzchowski@op.pl> napisał(a):

> A co mówi SMART?

HMM SPORO TEGO JEST ale powiem szczerze że niebardzo jestem obeznany w
analizowaniu informacji SMART. Poniżej wklejam wszelkie info które wypluł
smartctl pod linuxem. Ostrzegam że długie ;)

--
=== START OF INFORMATION SECTION ===
Device Model:     TOSHIBA MK8034GSX
Serial Number:    278AT0RXT
Firmware Version: AH301E
User Capacity:    80,026,361,856 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   7
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Thu Apr  2 12:07:58 2009 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status:  (0x80)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 ( 120) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  61) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED 
WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always     
 -       0
  2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline    
 -       0
  3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always     
 -       1613
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always     
 -       1267
  5 Reallocated_Sector_Ct   0x0033   100   100   050    Pre-fail  Always     
 -       0
  7 Seek_Error_Rate         0x000b   100   100   050    Pre-fail  Always     
 -       0
  8 Seek_Time_Performance   0x0005   100   100   050    Pre-fail  Offline    
 -       0
  9 Power_On_Hours          0x0032   087   087   000    Old_age   Always     
 -       5593
 10 Spin_Retry_Count        0x0033   125   100   030    Pre-fail  Always     
 -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always     
 -       1210
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always     
 -       26712
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always     
 -       52
193 Load_Cycle_Count        0x0032   096   096   000    Old_age   Always     
 -       48531
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always     
 -       51 (Lifetime Min/Max 14/55)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always     
 -       0
197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always     
 -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline    
 -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always     
 -       1
220 Disk_Shift              0x0002   100   100   000    Old_age   Always     
 -       168
222 Loaded_Hours            0x0032   087   087   000    Old_age   Always     
 -       5295
223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always     
 -       0
224 Load_Friction           0x0022   100   100   000    Old_age   Always     
 -       0
226 Load-in_Time            0x0026   100   100   000    Old_age   Always     
 -       412
240 Head_Flying_Hours       0x0001   100   100   001    Pre-fail  Offline    
 -       0
SMART Error Log Version: 1
ATA Error Count: 1
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 5372 hours (223 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 01 cb fd b4 e0  Error: ICRC, ABRT 1 sectors at LBA = 0x00b4fdcb = 11861451
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 40 aa fb b4 e0 00      00:28:15.906  READ DMA
  e7 00 00 00 00 00 a0 00      00:28:14.663  FLUSH CACHE
  ca 00 08 d8 19 1f e0 00      00:28:14.663  WRITE DMA
  ca 00 08 d0 19 1f e0 00      00:28:14.663  WRITE DMA
  ca 00 08 e0 19 1f e0 00      00:28:14.662  WRITE DMA
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours) 
LBA_of_first_error
# 1  Short offline       Completed without error       00%      1245         -
# 2  Extended offline    Interrupted (host reset)      70%       472         -
# 3  Short offline       Completed without error       00%       472         -
# 4  Short offline       Completed without error       00%        75         -
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 
-- 
Wysłano z serwisu Usenet w portalu Gazeta.pl -> http://www.gazeta.pl/usenet/
Received on Thu Apr 2 12:20:03 2009

To archiwum zostało wygenerowane przez hypermail 2.1.8 : Thu 02 Apr 2009 - 12:51:00 MET DST