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[ODLEW-PL] AVS 61st International Symposium & Exhibition (AVS-61) and fo

To: "Odlewnicza-PL" <odlew-pl@man.lodz.pl>
Subject: [ODLEW-PL] AVS 61st International Symposium & Exhibition (AVS-61) and focus
From: Krzysztof Hűbner PK <hubner@mech.pk.edu.pl>
Date: Mon, 24 Feb 2014 09:40:11 +0100

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Dear Colleagues,
We would like to bring your attention to the call for abstracts:
https://www.avs.org/Meetings-Exhibits/Call-For-Abstracts
to the AVS 61st International Symposium & Exhibition (AVS-61),
which will be held November 9-14, 2014 in Baltimore, Maryland.
It is a good opportunity to explore and report on new developments
in microscopy techniques applied to new materials, devices and interfaces.
In addition, on the behalf of the organizers, we invite you to submit an abstract
before the deadline of Monday, May 5th, to the special topical session
"Novel Trends in Synchrotron and FEL-Based Analysis"
https://www.avs.org/Meetings-Exhibits/Call-For-Abstracts/Focus-Topics#Synchrotron.
This focus session is organized for the first time and aims at dissemination of the unique research opportunities, offered by the advanced experimental techniques at X-ray, VUV or IR synchrotron and free electron laser facilities, to investigate the properties of matter with unprecedented space, spectral and time resolution. One or two more invited presentation will be selected by the program committee evaluating the abstracts. We look forward to receiving your abstract and seeing
you November in Baltimore, Maryland!
_______________________________________________________________________________
Andrei Kolmakov, PhD
Project Leader
Center for Nanoscale Science and Technology
National Institute of Standards and Technology

NIST 100 Bureau Drive
Bldg. 216/Rm.B117
Gaithersburg, MD 20899-6204
Phone: (301) 975-4724
Fax: (301) 975-2303
E-mail: andrei.kolmakov@nist.gov
URL: http://www.nist.gov/cnst/kolmakov.cfm


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3, 31 -- From: "Kolmakov, Andrei A." <andrei.kolmakov@nist.gov>
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3, 31 -- Subject: AVS 61st International Symposium & Exhibition (AVS-61) and focus
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