Nowoczesna mikroskopia skanigowa

Autor: <kjhubner_at_wyborcza.pl>
Data: Sat 18 Apr 2009 - 10:15:10 MET DST
Message-ID: <63914DE835024D77B2BF2609156D1654@kh00709>
Content-Type: text/plain; format=flowed; charset="iso-8859-2"; reply-type=original

Polecam zobaczenie tego linku FEI Company
Scanning Electron Microscope (SEM),
Transmission Electron Microscope (TEM),
DualBeam,
Focused Ion Beam (FIB) electron microscopes

http://www.fei.com/default.aspx
Received on Sat Apr 18 10:15:16 2009

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