Fw: [Microscopy] viaWWW: Advanced Techniques in Microscopy for Materials

Autor: KJ Hübner <hubner_at_iod.krakow.pl>
Data: Mon 30 Jan 2006 - 07:43:59 MET
Message-ID: <01f201c62568$8d1aad00$051d9c95@iod.krakow.pl>
Content-Type: text/plain; charset="iso-8859-2"

> Email: raynald.gauvin@mcgill.ca
> Name: Raynald Gauvin
>
> Organization: McGill University
>
> Title-Subject: [Filtered] Worshop
>
> Question: Title: Advanced Techniques in Microscopy for Materials
Characterization
>
> Lecturers: David Joy, University of Tennessee
> Eric Lifshin, State University of New York
> George Vander Voort, Buehler Ltd.
> Raynald Gauvin, McGill University
> Brendan Griffin, University of Western Australia
> Rocco Cerchiara, Fischione Instruments
> Pierre Hovington, Hydro-Quebec Research Institute
> Tom Kelly, Imago Scientific Instruments
> Scott Sitzman, HKL Technology
> Marin Lagace, Hydro-Quebec Research Institute
>
> When: May 8-12, 2006
>
> Where: McGill University, Department of Mining, Metals and Materials
> Engineering
> M.H.Wong Building
> 3610 University Street
> Montreal, Quebec, Canada
> H3A 2B2
>
> Contact: Prof. Raynald Gauvin
> Tel: (514) 398-8951
> Fax: (514) 398-4492
> E-mail: raynald.gauvin@mcgill.ca
>
>
> --------------------------------------------------------------------------
-
Received on Mon Jan 30 08:01:19 2006

To archiwum zosta³o wygenerowane przez hypermail 2.1.8 : Mon 30 Jan 2006 - 08:03:02 MET