Fw: [Microscopy] MSMXIV Conference: Final Call for Papers

Royal Microscopical Society
Institute of Physics
Materials Research Society

14th International Conference on

MICROSCOPY OF SEMICONDUCTING MATERIALS

11 - 14 April 2005, University of Oxford, UK

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Final Call for Papers
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This international conference will focus on the state-of-the-art in the
study of the structural and electrical properties of semiconductors
by the application of transmission and scanning electron
microscopy, scanning probe microscopy, X-ray techniques and all
related assessment methods.

Special conference sessions will concentrate on recent
developments in high-resolution imaging and analytical (S)TEM,
advances in SPM and SEM applications, the important
characteristics of epitaxial layers (including III-nitrides), quantum
nanostructures (dots, wires and wells), the effects of advanced
device processing treatments (especially for silicon technology),
metal-semiconductor contacts and silicides, together with critical
device properties, FIB applications and failure analysis. Prominent
invited speakers will introduce each topic area: full details are given
at the conference web site:
http://www.rms.org.uk/MSMXIV

The Proceedings of the conference will be published and the final
call for papers has now been issued. Abstracts (deadline 3
DECEMBER 2004) should be submitted by E-mail to lucy@rms.org.uk.

Additional general conference information can be obtained from the
Secretariat at the RMS (lucy@rms.org.uk). The conference
Chairmen are Prof Tony Cullis (a.g.cullis@sheffield.ac.uk) and Dr
John Hutchison (john.hutchison@materials.ox.ac.uk), who may be contacted with any scientific programme enquiries.

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Professor Tony Cullis FRS
Dept of Electronic and Electrical Eng
University of Sheffield
Mappin Street
Sheffield
S1 3JD, UK

Tel: +44-114-222-5407
Fax: +44-114-272-6391
E-mail: a.g.cullis@sheffield.ac.uk
Received on Mon Nov 15 11:19:36 2004