Fw: [Microscopy] LEHIGH MICROSCOPY SCHOOL

>
> LEHIGH MICROSCOPY SCHOOL
>
> Lehigh University, Bethlehem, PA U.S.A.
> June 6-18, 2004
>
> * Scanning Electron Microscopy and X-ray Microanalysis
>
> * Introduction to SEM and EDS for the New SEM Operator
>
> * Analytical Electron Microscopy Analysis for TEM Specimens
>
> * Atomic Force Microscopy and Other Scanned Probe Microscopes
>
> * Characterization of Nanostructures
>
> * Focused Ion Beam Instrumentation and Applications
>
> * Problem Solving with SEM and X-ray Microanalysis
>
> * Quantitative X-ray Microanalysis of Bulk Specimens and Particles
>
> * Particle Characterization, Preparation, Microscopy, and Analysis
>
> See course descriptions at:
> <http://www.lehigh.edu/microscopy>www.lehigh.edu/microscopy
>
> For more information contact
> Sharon Coe at 610.758.5133
> <mailto:Sharon.coe@Lehigh.edu>Sharon.coe@Lehigh.edu
>
>
>
> ********************************
> Sharon L. Coe
> Events Coordinator
> Lehigh Microscopy School
> 5 East Packer Avenue
> Bethlehem, PA 18015
> 610-758-5133 (phone)
> 610-758-4244 (fax)
> <mailto:slc6@lehigh.ed>slc6@lehigh.ed
> <http://www.lehigh.edu/microscopy>www.lehigh.edu/microscopy
>
> ********************************
>
>
Received on Mon Apr 19 08:42:09 2004