Fw: Electron Microscopy and Analysis Conference 2003

Autor: Krzysztof Jan Hübner <hubner_at_IOd.krakow.pl>
Data: Tue 08 Oct 2002 - 07:27:02 MET DST
Message-ID: <001b01c26e8b$559da720$051d9c95@iod.krakow.pl>
Content-Type: text/plain; charset="iso-8859-1"

>
> ***************************************************************
> First Announcement
>
> Electron Microscopy and Analysis Conference 2003
> The University of Oxford
> 3 - 5 September 2003
>
> Organised by the Electron Microscopy and Analysis Group of the Institute
of
> Physics
> Co-sponsored by the Royal Microscopical Society
>
> Scientific Content
> Electron Microscopy is going through the most revolutionary period since
its
> invention, with leaps in performance of sources, imaging lenses and
> spectrometers all at roughly the same time. Scanning probe techniques are
> also maturing into useful analytical tools. This is an ideal time for the
> microscopy community to appraise when, how and why we use different
> techniques to gain different scientific insights. The conference will
> address all aspects of electron and scanning probe microscopy and
> associated spectroscopy including:
>
> o New Instrumentation - including Aberration Correction
and
> Monochromation
> o New Information from New Instrumentation - Applications
> Highlighting Novel Techniques
> o Advances in Nanoanalysis - EDX, PEELS and Other
Analytical
> Techniques
> o State-of-the-art SEM, Scanning Probe Microscopy and
> Surface Science
> o High-resolution Electron Microscopy and Electron
> Crystallography
> o Advances in Sample Preparation
>
> Applications of microscopy and related techniques will be divided into
> sessions according to demand.
> These will include experiments in:
>
> o Biogenic Materials
> o Catalysis
> o Ceramics and Electroceramics
> o Composites
> o Environmental Samples
> o Ferrous and Non-Ferrous Metals
> o Fullerenes, Hard Carbon and Related Materials
> o Intermetallics
> o Interfaces and Surfaces
> o Magnetic Materials
> o Sensor Materials
> o Semiconductors
> oSuperconductors
>
> Sessions of oral and poster presentations will be arranged, and, where
> possible, associated with invited
> keynote speakers. Papers from post-graduate students are particularly
> encouraged; student bursaries
> will be available through the Institute of Physics EMAG Group.
>
> Advanced School
> The Advanced School provides an opportunity for postgraduate students,
> research assistants and others with an interest to learn about a range of
> advanced imaging techniques in electron and related microscopies
techniques
> from experts in the field. The school will involve a combination of
tutorial
> lectures and hands-on demonstrations in the Department of Materials, using
> the wide range of sophisticated instrumentation available there. The
> lecturers/demonstrators will be leading exponents in the techniques
> concerned. There will be considerable opportunity for interaction. To
> maximise the effectiveness of the School, numbers will be limited to about
> 20.
>
> Trade Exhibition
> Accompanying the conference there will be a trade exhibition where
delegates
> and visitors will be able to see and discuss the latest products and
> developments.
>
> Social Programme
> The social programme will include a welcome reception, an Exhibitor Buffet
> and a conference dinner. Further details will be available in due course.
>
> Conference Venue
> The scientific sessions, the Exhibition and the poster presentations will
> take place at the Oxford University Examination Schools. For more
> information about how to get to Oxford please visit the Oxford
> University web site at http://www.ox.ac.uk/aboutoxford/how.shtml
>
> Important Dates
> January 2003 all for Papers
> 21 March 2003 Deadline for Abstract Submission
> May 2003 Registration Mailing
> 18 July 2003 Deadline for Registration
>
>
> Organising Committee
>
> EMAG Chairman R M D Brydson
> Local Committee Chairman A Petford-Long/J Hutchison
> Programme Organiser A Bleloch
> Proceedings Editor S McVitie
> Exhibition Organiser R Doole
> Advanced School Organiser D J Cockayne
>
> General Enquiries
> Jasmina Bolfek-Radovani, The Institute of Physics, 76 Portland Place,
London
> W1B 1NT
> Tel +44 (0)20 7470 4800 Fax: +44 (0)20 7470 4900
> Email: conferences@iop.org
> http://physics.iop.org/IOP/Confs/EMG/
>
> Exhibition Enquiries
> Ron Doole, EMAG03, Department of Materials, University of Oxford, Parks
> Road, Oxford., OX1 3PH
> Tel: + 44 (0)1865 273701 Fax: + 44 (0)1865 283333
> Email:ron.doole@materials.oxford.ac.uk
>
>
> Media Registration
> Accredited journalists are welcome to attend all or part of this meeting
> free-of-charge. To qualify for free
> registration please contact Alice Bows, Press Officer, Public Affairs
> Department, Tel: +44 (0)20 7470 4800, Fax: +44 (0)20 7470 4848, Email:
> alice.bows@iop.org.
>
>
Received on Tue Oct 8 07:39:06 2002

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