Fw: Post Doctoral Positions

The National Institute of Standards & Technology (NIST) has many Post
Doctoral Positions open. These are offered competitively through the
National Research Council (NRC). Within microscopy/microanalysis/surface
analysis research areas we have many possible openings described at the NRC
web sites listed below. The Microanalysis Research and Analytical
Microscopy Groups at NIST have about twenty full time scientists
specializing in the measurement methods in our extensive facilities
including SEMs (FEG, EPMA, Environmental,.), AEMs (FEG/LaB6
TEM/STEM/EDS/EELS), Auger probes, SIMS/TOF-SIMS, MicroXRD/XRF,
MicroRaman/IR, Synchrotron beam-line with grazing incidence XPS, etc. We
research new and improved measurement methods and we apply these methods to
challenging analytical problems in semiconductor and optoelectronic
technology, materials science, environmental and earth science, etc.

If you have research ideas that would be related to the analytical
approaches below and are looking for a Post Doc opportunity, please contact
me.

The NIST/NRC program offers a two-year Post Doc at an annual salary of
$50,000 with an additional $5,500 for research expenses. The applications
are due to the NRC by Jan 15, 2001. This includes a brief proposal and
several recommendations.

A candidate must be a U.S. citizen and start work (with their PhD in hand)
at NIST between July 1, 2001 and Feb 1, 2002. So, this is the perfect
opportunity for those that are graduating this spring through next fall and
others that have received their degree within the last five years. Please
note that NIST/NRC only competes Post Doc positions once a year, unlike some
other institutions.

General NIST-NRC Post Doc Information
http://www4.nas.edu/osep/rap.nsf/vwLabInformation/03AF8E43C706150B852567FB00
4AB8E8?OpenDocument

Specific areas of interest:

Chemical Imaging
http://www4.nas.edu/osep/rap.nsf/ByTitle/5273986D8FFE74B18525691F0060BD9F?Op
enDocument&50~NIST

Field Emission Analytical Electron Microscopy/Nanoscale Compositional
Mapping
http://www4.nas.edu/osep/rap.nsf/ByTitle/65DE73654E7869028525691F0060A463?Op
enDocument&50~NIST

Electron-Probe Microanalysis/Scanning Electron Microscopy
http://www4.nas.edu/osep/rap.nsf/ByTitle/F704FABB051A2EE48525691F0060A4B5?Op
enDocument&50~NIST

Microchemistry in the Environmental Scanning Electron Microscope
http://www4.nas.edu/osep/rap.nsf/ByTitle/944FC47A85E417348525691F0060C301?Op
enDocument&50~NIST

Microbeam Mass Spectrometry
http://www4.nas.edu/osep/rap.nsf/ByTitle/623A17BC37343CDC8525691F0060A44D?Op
enDocument&50~NIST

Nanoscale Crystallographic Analysis and Compound Identification by
Diffraction Methods
http://www4.nas.edu/osep/rap.nsf/ByTitle/39166A04610797758525691F0060C316?Op
enDocument&50~NIST

Optical Probe Microanalysis (Raman, IR Microprobes, and NSOM)
http://www4.nas.edu/osep/rap.nsf/ByTitle/78E3849178AC6C718525691F0060A43A?Op
enDocument&50~NIST

Submicroscopic Chemical and Physical Characterization of Materials and
Particles
http://www4.nas.edu/osep/rap.nsf/ByTitle/9C8BD7F79A5AAACE8525691F0060A4A1?Op
enDocument&50~NIST

Surface Microanalysis by Combined Auger Electron and X-Ray Emission
Spectroscopies
http://www4.nas.edu/osep/rap.nsf/ByTitle/9ACCD2318EE9230F8525691F0060B7E6?Op
enDocument&50~NIST

X-Ray Investigations of Thin Films, Surfaces, and Interfaces
http://www4.nas.edu/osep/rap.nsf/ByTitle/362CD137E15600568525691F0060A4D5?Op
enDocument&50~NIST

Instrument Performance Standards for Raman Spectroscopy
http://www4.nas.edu/osep/rap.nsf/ByTitle/5E60A8DDDF3EB7DE8525691F0060BF12?Op
enDocument&50~NIST

Quantitative Surface Analysis by Electron Spectroscopy
http://www4.nas.edu/osep/rap.nsf/ByTitle/D0188B23B4CC87B78525691F0060BD89?Op
enDocument&50~NIST

Eric B. Steel, Leader e-mail: eric.steel@nist.gov
Microanalysis Research Group Office: 301-975-3902
N.I.S.T. FAX: 301-417-1321
100 Bureau Drive, Stop 8371
Gaithersburg, MD 20899-8371
http://www.nist.gov/cstl/div837/837.02/
Received on Thu Nov 9 08:37:05 2000